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46 lines
2.3 KiB
46 lines
2.3 KiB
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layout: banner
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title: Applications
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permalink: /applications/
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cardTitle: Topics
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cardDesc: We tackle a broad set of problems relating to the electromagnetic phenomena, from antennas and propagation, to electromagnetic interference/compatiblity, to wireless communication.
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---
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{: .centerHeading }
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# Engineering Applications
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## Full-Wave Field Solvers for Signal Integrity (SI) and EM Interference (EMI) Analysis of Product-Level Integrated Circuits (ICs) and Electronics
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Ever-increasing complexity in high-speed electronic devices and systems presents significant computational challenges in numerical analysis in terms of desired accuracy, efficiency, and scalable parallelism. We investigate high-resolution, high-performance full-wave field solvers for scalable electromagnetic simulations of product-level integrated circuits (ICs) and electronics.
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[Read More](/applications/SIEMI/)
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## Stochastic Wave Model Statistically Replicating Reverberation Chambers
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We present a novel physics-oriented statistical representation for complex multipath environments, and develop a hybrid deterministic and stochastic formulation incorporating component-specific features. The advancements lead to a stochastic wave model statistically replicating mode-stirred reverberation chambers, and establish an imperative design-under-chaos capability for electronic devices and systems. The research work is evaluated and validated through representative experiments.
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[Read More](/applications/reverberation-chamber/)
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## Deterministic and Statistical Modeling of Wireless Channel
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We present a full-wave field-based computational methodology for radio wave propagation in complex urban environments. Both transmitting/receiving antennas and propagation environments are modeled by first-principles calculations. System-level, large scene analysis is enabled by scalable, ultra-parallel algorithms on emerging high-performance computing platforms. The proposed computational framework is verified and validated with semi-analytical models and representative measurements.
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[Read More](/applications/statistical-channel/)
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